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31 August 2009 Sensitive measurement of optical nonlinearities of ZnSe based on a phase object
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Proceedings Volume 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging; 73824A (2009) https://doi.org/10.1117/12.835499
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China
Abstract
A nonlinear image technique for characterization of the optical nonlinearities is used to investigate the solid semiconductor ZnSe at 600 nm. The method based on a 4f nonlinear image technique with a phase object is used to obtain the diffraction pattern of the nonlinear filter in solid ZnSe located at the Fourier plane by a CCD camera. The nonlinear absorption coefficient and nonlinear refraction index were both obtained by fitting the nonlinear image. Good agreement between the experiment data and the simulated result are obtained indicating a sensitive and powerful method for nonlinear optical measurements.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chang Wei Li, Yu Xiao Wang, Min Shui, Xiao Jin, Jun Yi Yang, Xue Ru Zhang, Kun Yang, and Ying Lin Song "Sensitive measurement of optical nonlinearities of ZnSe based on a phase object", Proc. SPIE 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging, 73824A (31 August 2009); https://doi.org/10.1117/12.835499
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