5 August 2009 Athermalization and test validation of infrared imaging system
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Abstract
Usually, infrared optical system design and test in normal temperature conditions. In fact, infrared system work in the larger temperature range. In this paper, for satisfying the special environmental tempreture requirements, an optically passive athermal infrared optical system working in the 3~5 micron mid wavelength infrared band was designed. The design principle, design results are described. In addition, the optical system was incorporated with an infrared focal plane array forming an infrared camera. The thermal test of imaging quality of this camera is also presented,which validated the athermalisation.The thermal testing method is simple, intuitive, high credibility. The result shows that the IR optical system has good athermal performances in large working temperature range with simple configuration.
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Qiu Huang, Yi-qing Chen, Zhi-feng Gao, Xue-feng Zhai, Bo Song, "Athermalization and test validation of infrared imaging system", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73830P (5 August 2009); doi: 10.1117/12.835009; https://doi.org/10.1117/12.835009
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