5 August 2009 Low-frequency noise characteristics of extended wavelength InGaAs infrared detector
Author Affiliations +
Abstract
In order to investigate the low frequency noise characteristics of extended wavelength (1.0-2.4 μm) InGaAs infrared detector, we fabricated a number of In0.78Ga0.22As mesa photodiodes with various areas and tested the low frequency noise of these detectors. The results indicate that the noise spectra in low frequency region are proportional to f - γ where γ is around 0.9 for all of the diodes. The investigation on relationship between low frequency noise and bias voltage shows that the dependence of low frequency noise on reverse bias is based on the dependence of dark current. Then the dependence of low frequency noise on dark current in these reverse-biased diodes was examined, the noise and dark current of several diodes were measured at same voltage. The results of the noise power spectral density at f = 1 Hz indicate that noise varies proportionally with the dark current. The relationship between mesa geometry and noise magnitude was also investigated. Low frequency noise of diodes with different mesa areas was compared and the noise exhibits a linear dependence on the mesa areas.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tao Li, Tao Li, Kafeng Zhang, Kafeng Zhang, Yongfu Li, Yongfu Li, Hengjing Tang, Hengjing Tang, Xue Li, Xue Li, Haimei Gong, Haimei Gong, } "Low-frequency noise characteristics of extended wavelength InGaAs infrared detector", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73833Z (5 August 2009); doi: 10.1117/12.835983; https://doi.org/10.1117/12.835983
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

Short-wave infrared detector tradeoffs and applications
Proceedings of SPIE (January 22 2003)
Status of MCT focal plane arrays in France
Proceedings of SPIE (May 31 2012)
Performance of uncooled microcantilever thermal detectors
Proceedings of SPIE (January 21 2005)
Latest developments of MCT focal plane arrays in France
Proceedings of SPIE (October 23 2012)
Response of long-wave MCT detectors to microwaves
Proceedings of SPIE (June 30 1992)

Back to Top