Performance evaluation of MCT arrays developed for SWIR and hyperspectral applications: test bench and preliminary results

L. Duvet; E. Martin; N. Nelms

doi:10.1117/12.835608

5 August 2009 Performance evaluation of MCT arrays developed for SWIR and hyperspectral applications: test bench and preliminary results

L. Duvet, E. Martin, N. Nelms

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Proceedings Volume 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications; 73834Q (2009) https://doi.org/10.1117/12.835608
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

We report here the first results of a performance evaluation program of two MCT arrays developed under ESA (European Space Agency) contracts by SOFRADIR. The program will first somehow repeat the electro-optical tests performed by the manufacturer and then focus on dark current and quantum efficiency. The first detector has a cut-off at 2.5 um and a format of 1000 x 256 (so called "SHOWMA") with 30 um pitch. A customized dewar has been manufactured in order to allow in particular a proper dark current measurements over a wide range of temperature. The second detector has a cut-off at 2.2 um with a format of 500 x256 (so called "BEPI") and a 30 um pitch. The particularity of the second detector is to have the CdZnTe substrate removed, leading to a sensitivity down to 0.4 um, as was requested for the targeted application (hyperspectral imager on board Bepi Colombo). It was delivered in a sealed dedicated miniaturized dewar with cooler. A complete electro-optical test bench has been developed and its commissioning will also be detailed. The test bench allows in particular quantum efficiency measurements over the full wavelength range 0.3 to 2.5 um.

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L. Duvet, E. Martin, and N. Nelms "Performance evaluation of MCT arrays developed for SWIR and hyperspectral applications: test bench and preliminary results", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73834Q (5 August 2009); https://doi.org/10.1117/12.835608

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KEYWORDS

Sensors

Manufacturing

Capacitance

Short wave infrared radiation

Staring arrays

Electro optics

Imaging systems

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