4 August 2009 Measuring method for refractive index of metal with terahertz time domain reflection spectroscopy
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Abstract
A method for measuring the refractive index of metal bulks in the terahertz region with terahertz time domain vertical reflection spectroscopy is proposed. In the experiment, the terahertz wave forms generated by laser induced air plasma and reflected by a silicon wafer and metal bulks are measured respectively. The Kramers-Kronig transformation is used to reduce the phase shift error that influences the accuracy on the experimental results. The refractive index of a silicon wafer, which was measured with terahertz time domain transmission spectroscopy, is used as a reference in the terahertz time domain reflection spectroscopy. Therefore the complex refractive index of metal has been obtained by the Fresnel law in the presence of the known silicon refractive index. By this method, the refractive indices of aluminum and copper plates in the terahertz region are measured, furthermore, these experimentally obtained results are discussed with the simple Drude model.
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Wenfeng Sun, Wenfeng Sun, Xinke Wang, Xinke Wang, Yan Zhang, Yan Zhang, Cunlin Zhang, Cunlin Zhang, "Measuring method for refractive index of metal with terahertz time domain reflection spectroscopy", Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851F (4 August 2009); doi: 10.1117/12.835535; https://doi.org/10.1117/12.835535
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