Investigation on the two-step passivation process for CdZnTe detectors

Dongni Hu; Linjun Wang; Jiahua Min; Yue Lu; Jianyong Teng; Kaifeng Qin; Jijun Zhang; Jian Huang; Yiben Xia

doi:10.1117/12.835534

4 August 2009 Investigation on the two-step passivation process for CdZnTe detectors

Dongni Hu, Linjun Wang, Jiahua Min, Yue Lu, Jianyong Teng, Kaifeng Qin, Jijun Zhang, Jian Huang, Yiben Xia

Proceedings Volume 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications; 73851G (2009) https://doi.org/10.1117/12.835534
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

In this paper, the composition, morphology and electrical properties of the passivation layer for CdZnTe detectors were investigated. A two-step passivation was performed under different conditions, including passivation time, temperature and NH₄F/H₂O₂ concentration. The obtained passivation layers were characterized by XRD, SEM, XRF and I-V methods. The results showed that the best passivation condition was with the NH₄F/H₂O₂ concentration of 10wt%, passivation time of 40min and temperature of 20ºC. Under this condition, the passivation layer was purely oxidized and compact, and the surface leakage current of CZT crystals was most effectively reduced.

Citation Download Citation

Dongni Hu, Linjun Wang, Jiahua Min, Yue Lu, Jianyong Teng, Kaifeng Qin, Jijun Zhang, Jian Huang, and Yiben Xia "Investigation on the two-step passivation process for CdZnTe detectors", Proc. SPIE 7385, International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications, 73851G (4 August 2009); https://doi.org/10.1117/12.835534

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