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4 August 2009 Swept-source full-field optical coherence microscopy
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Proceedings Volume 7386, Photonics North 2009; 738604 (2009)
Event: Photonics North 2009, 2009, Quebec, Canada
Full-Field Optical Coherence Microscopy (FF-OCM) is a microscopic imaging device based on interferometry. It can produce cross-sectional images of bio-tissue or cell samples at a resolution in the order of a micron. Because it can extract an en-face image directly from the sample, it does not need 2D scanning mechanism, which greatly increases the imaging speed compared to fibre-based OCT systems. However, a controlled translation stage is still required in the reference arm of the interferometer to perform the depth scan. Swept-Source OCT (SS-OCT) technology is the second generation of the OCT systems, which not only removes the mechanical scanning, but also increases the signal / noise ratio of the extracted OCT images. In this paper, we describe the design and implementation of a swept-wavelength source based FF-OCM with 60X magnification; 8 um depth resolution; 4 μm depth resolution; 20 mm working distance and 15 frames / second imaging speed.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shoude Chang, Sherif Sherif, Youxin Mao, and Costel Flueraru "Swept-source full-field optical coherence microscopy", Proc. SPIE 7386, Photonics North 2009, 738604 (4 August 2009);


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