Translator Disclaimer
4 August 2009 Swept-source full-field optical coherence microscopy
Author Affiliations +
Proceedings Volume 7386, Photonics North 2009; 738604 (2009) https://doi.org/10.1117/12.838213
Event: Photonics North 2009, 2009, Quebec, Canada
Abstract
Full-Field Optical Coherence Microscopy (FF-OCM) is a microscopic imaging device based on interferometry. It can produce cross-sectional images of bio-tissue or cell samples at a resolution in the order of a micron. Because it can extract an en-face image directly from the sample, it does not need 2D scanning mechanism, which greatly increases the imaging speed compared to fibre-based OCT systems. However, a controlled translation stage is still required in the reference arm of the interferometer to perform the depth scan. Swept-Source OCT (SS-OCT) technology is the second generation of the OCT systems, which not only removes the mechanical scanning, but also increases the signal / noise ratio of the extracted OCT images. In this paper, we describe the design and implementation of a swept-wavelength source based FF-OCM with 60X magnification; 8 um depth resolution; 4 μm depth resolution; 20 mm working distance and 15 frames / second imaging speed.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Shoude Chang, Sherif Sherif, Youxin Mao, and Costel Flueraru "Swept-source full-field optical coherence microscopy", Proc. SPIE 7386, Photonics North 2009, 738604 (4 August 2009); https://doi.org/10.1117/12.838213
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Full-field optical coherence microscopy
Proceedings of SPIE (July 28 2004)
A swept source OCT at 1300 nm with angular compounding...
Proceedings of SPIE (December 29 2008)
Enhancement of the signal to noise ratio at depths in...
Proceedings of SPIE (January 30 2012)
Full-field swept-source phase microscopy
Proceedings of SPIE (February 19 2006)
Theory and applications of multi-beam OCT
Proceedings of SPIE (December 29 2008)

Back to Top