System for variable stripe length optical gain measurements in structures containing silicon nanocrystals

D. Koshel; D. Barba; F. Martin; G. G. Ross

doi:10.1117/12.836995

4 August 2009 System for variable stripe length optical gain measurements in structures containing silicon nanocrystals

D. Koshel, D. Barba, F. Martin, G. G. Ross

Proceedings Volume 7386, Photonics North 2009; 73860X (2009) https://doi.org/10.1117/12.836995
Event: Photonics North 2009, 2009, Quebec, Canada

Abstract

The variable stripe length (VSL) is a convenient method for the measurement of optical gain. However, several inherent experimental constraints such as pump beam non-uniformity, diffraction from the movable cache and sample edges, and gain saturation challenge its proper implementation. A modified VSL configuration, which addresses these constraints, has been developed and implemented for gain measurements in SiO₂ structures containing silicon nanocrystals. A microprocessor based acquisition of several control parameters provides reliable and reproducible optical gain measurements.

Citation Download Citation

D. Koshel, D. Barba, F. Martin, and G. G. Ross "System for variable stripe length optical gain measurements in structures containing silicon nanocrystals", Proc. SPIE 7386, Photonics North 2009, 73860X (4 August 2009); https://doi.org/10.1117/12.836995

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