13 September 2010 A portable optical DSPI strain sensor with radial sensitivity using an axis-symmetrical DOE
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73870B (2010) https://doi.org/10.1117/12.869665
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
This paper presents the optical setup of a radial in-plane digital speckle pattern interferometer (DSPI) which uses an axissymmetrical diffractive optical element to obtain double illumination. The application of the DOE gives true in-plane sensitivity that is independent on the wavelength of the laser used as illumination source. Furthermore, it only depends on the grating period of the DOE. A new optical layout was introduced in order to obtain a circular measurement area of about 5 mm in diameter. A brief description of the DOE and the portable strain sensor are presented. A detailed explanation of the clamping system is presented showing its ability to deal with rigid body displacements. Finally, some experimental results are shown enlightening that it is able to measure mechanical stress fields from only one difference phase map.
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Matias R. Viotti, Matias R. Viotti, Walter A. Kapp, Walter A. Kapp, Armando Albertazzi Gonçalves, Armando Albertazzi Gonçalves, "A portable optical DSPI strain sensor with radial sensitivity using an axis-symmetrical DOE", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73870B (13 September 2010); doi: 10.1117/12.869665; https://doi.org/10.1117/12.869665
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