Paper
13 September 2010 In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm
Y. Arai, M. Kikukawa, S. Yokozeki
Author Affiliations +
Proceedings Volume 7387, Speckle 2010: Optical Metrology; 738710 (2010) https://doi.org/10.1117/12.870461
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
Dynamic deformation measurement with a large in-plane deformation is performed by using virtual speckle patterns. The virtual speckle pattern has been generally produced by using Fourier technology. However, it takes a long calculating time to produce a virtual speckle pattern under Fourier technology, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by Carré algorithm without any operation by Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is almost equal to the ordinary methods in measurement accuracy.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Arai, M. Kikukawa, and S. Yokozeki "In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 738710 (13 September 2010); https://doi.org/10.1117/12.870461
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KEYWORDS
Speckle pattern

Phase shifts

Fourier transforms

Speckle interferometry

Speckle

Cameras

Fringe analysis

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