13 September 2010 In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 738710 (2010) https://doi.org/10.1117/12.870461
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
Dynamic deformation measurement with a large in-plane deformation is performed by using virtual speckle patterns. The virtual speckle pattern has been generally produced by using Fourier technology. However, it takes a long calculating time to produce a virtual speckle pattern under Fourier technology, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by Carré algorithm without any operation by Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is almost equal to the ordinary methods in measurement accuracy.
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Y. Arai, Y. Arai, M. Kikukawa, M. Kikukawa, S. Yokozeki, S. Yokozeki, } "In-plane-displacement measurement by speckle interferometry using virtual speckle pattern based on Carré algorithm", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 738710 (13 September 2010); doi: 10.1117/12.870461; https://doi.org/10.1117/12.870461
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