13 September 2010 Aspects of speckle contrast metrology
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73871U (2010) https://doi.org/10.1117/12.870674
Event: Speckle 2010, 2010, Florianapolis, Brazil
Recent revitalization of interests in applying speckle techniques gives rise to the concern of measurement accuracy. In particular, speckle contrast, an important metric in numerous optical techniques, is affected by many factors related to light sources, propagation media, and receivers. As a result, proper experimental design is required to minimize measurement errors. This article considers errors introduced by the discrepancy of incidence and observation angles, by the limited number of available speckles, and by intensity saturation.
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L. Tchvialeva, L. Tchvialeva, I. Markhvida, I. Markhvida, T. K. Lee, T. K. Lee, } "Aspects of speckle contrast metrology", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73871U (13 September 2010); doi: 10.1117/12.870674; https://doi.org/10.1117/12.870674

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