Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm

Y. Arai; Y. Tsutsumi; S. Yokozeki

doi:10.1117/12.824186

17 June 2009 Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm

Y. Arai, Y. Tsutsumi, S. Yokozeki

Author Affiliations +

Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73890I (2009) https://doi.org/10.1117/12.824186
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

Temporal carrier has been introduced to electronic speckle interferometry (ESPI) in order to produce virtual speckle patterns. Dynamic deformation measurement with a large deformation is performed by using virtual speckle patterns. However, it takes a long calculating time to produce virtual speckle patterns, because the method requires Fourier transform operation at each pixel of CCD. In the proposed method, virtual speckle patterns are produced by algorithm without Fourier transform. As the results, it is confirmed that the calculating cost of virtual speckle patterns is improved remarkably, and that the new method also is equal to the ordinary methods in measurement accuracy.

Citation Download Citation

Y. Arai, Y. Tsutsumi, and S. Yokozeki "Out-of-plane deformation dynamic measurement method by using virtual speckle pattern based on Carré algorithm", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73890I (17 June 2009); https://doi.org/10.1117/12.824186

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