Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes

Alexander V. Goncharov; Vladislav V. Druzhin; Vladislav I. Batshev

doi:10.1117/12.827513

17 June 2009 Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes

Alexander V. Goncharov, Vladislav V. Druzhin, Vladislav I. Batshev

Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73891A (2009) https://doi.org/10.1117/12.827513
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

Abstract

Non-contact methods for testing of large rotationally symmetric convex aspheric mirrors are proposed. These methods are based on non-null testing with side illumination schemes, in which a narrow collimated beam is reflected from the meridional aspheric profile of a mirror. The figure error of the mirror is deduced from the intensity pattern from the reflected beam obtained on a screen, which is positioned in the tangential plane (containing the optical axis) and perpendicular to the incoming beam. Testing of the entire surface is carried out by rotating the mirror about its optical axis and registering the characteristics of the intensity pattern on the screen. The intensity pattern can be formed using three different techniques: modified Hartman test, interference and boundary curve test. All these techniques are well known but have not been used in the proposed side illumination scheme. Analytical expressions characterizing the shape and location of the intensity pattern on the screen or a CCD have been developed for all types of conic surfaces. The main advantage of these testing methods compared with existing methods (Hindle sphere, null lens, computer generated hologram) is that the reference system does not require large optical components.

Citation Download Citation

Alexander V. Goncharov, Vladislav V. Druzhin, and Vladislav I. Batshev "Noncontact methods for optical testing of convex aspheric mirrors for future large telescopes", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73891A (17 June 2009); https://doi.org/10.1117/12.827513

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available