Confocal microscopy and spectroscopy of defect photoluminescence in single SiO2 nanoparticles

Anna M. Chizhik; Torsten Schmidt; Alexey I. Chizhik; Friedrich Huisken; Alfred Meixner

doi:10.1117/12.825288

1 September 2009 Confocal microscopy and spectroscopy of defect photoluminescence in single SiO₂ nanoparticles

Anna M. Chizhik, Torsten Schmidt, Alexey I. Chizhik, Friedrich Huisken, Alfred Meixner

Proceedings Volume 7393, Nanophotonic Materials VI; 739305 (2009) https://doi.org/10.1117/12.825288
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

We present new results on single SiO₂ nanoparticles (SiO₂ NPs). NPs were obtained by full oxidation in water of silicon nanocrystals synthesized by CO₂ laser pyrolysis of SiH4. Samples of SiO₂ NPs embedded in low concentration in a thin polymer layer were prepared by spin-coating a dedicated solution on quartz cover slides. Using focused higher order laser modes, we determine the three-dimensional orientation of the nanoparticles' transition dipole moment (TDM). The SiO₂ NPs were found to possess a quite stable and randomly oriented TDM. However, characteristic dynamical effects featuring single NPs such as fluorescence intermittency and TDM flipping could also be observed. Photoluminescence (PL) spectroscopy of single SiO₂ NPs revealed spectra with a double-peak structure consisting of a narrow zero-phonon line and a broader phonon band. The phonon band can be attributed to longitudinal optical phonons excited in the SiO₂ network.

Citation Download Citation

Anna M. Chizhik, Torsten Schmidt, Alexey I. Chizhik, Friedrich Huisken, and Alfred Meixner "Confocal microscopy and spectroscopy of defect photoluminescence in single SiO₂ nanoparticles", Proc. SPIE 7393, Nanophotonic Materials VI, 739305 (1 September 2009); https://doi.org/10.1117/12.825288

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