1 September 2009 Confocal microscopy and spectroscopy of defect photoluminescence in single SiO2 nanoparticles
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Abstract
We present new results on single SiO2 nanoparticles (SiO2 NPs). NPs were obtained by full oxidation in water of silicon nanocrystals synthesized by CO2 laser pyrolysis of SiH4. Samples of SiO2 NPs embedded in low concentration in a thin polymer layer were prepared by spin-coating a dedicated solution on quartz cover slides. Using focused higher order laser modes, we determine the three-dimensional orientation of the nanoparticles' transition dipole moment (TDM). The SiO2 NPs were found to possess a quite stable and randomly oriented TDM. However, characteristic dynamical effects featuring single NPs such as fluorescence intermittency and TDM flipping could also be observed. Photoluminescence (PL) spectroscopy of single SiO2 NPs revealed spectra with a double-peak structure consisting of a narrow zero-phonon line and a broader phonon band. The phonon band can be attributed to longitudinal optical phonons excited in the SiO2 network.
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Anna M. Chizhik, Anna M. Chizhik, Torsten Schmidt, Torsten Schmidt, Alexey I. Chizhik, Alexey I. Chizhik, Friedrich Huisken, Friedrich Huisken, Alfred Meixner, Alfred Meixner, } "Confocal microscopy and spectroscopy of defect photoluminescence in single SiO2 nanoparticles", Proc. SPIE 7393, Nanophotonic Materials VI, 739305 (1 September 2009); doi: 10.1117/12.825288; https://doi.org/10.1117/12.825288
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