29 August 2009 Using holographic optical tweezers to measure forces with SPM-like probes
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Proceedings Volume 7400, Optical Trapping and Optical Micromanipulation VI; 74001X (2009); doi: 10.1117/12.826027
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States
Abstract
Holographic optical tweezers are used to assemble and control probes made from high aspect-ratio CdS and SiO2 nanorods and SiO2 microspheres. Analysis of the probe position allows for the measurement of forces experienced by the tip in a manner analogous to existing scanning probe microscopy (SPM) techniques.
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J. A. Grieve, D. M. Carberry, L. Ikin, G. M. Gibson, M. J. Padgett, M. J. Miles, "Using holographic optical tweezers to measure forces with SPM-like probes", Proc. SPIE 7400, Optical Trapping and Optical Micromanipulation VI, 74001X (29 August 2009); doi: 10.1117/12.826027; https://doi.org/10.1117/12.826027
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KEYWORDS
Optical tweezers

Nanorods

Silica

Scanning probe microscopy

Holography

3D metrology

Cadmium sulfide

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