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A decade of commitment from the NIST Manufacturing Engineering Laboratory to nanomanufacturing and nanometrology
Silica nanoparticle dispersion size measurement using dielectrophoresis on a microfabricated electrode array
Non-linear distortions caused by AFM-tip geometry and limitations of reconstruction on discrete data
Experimental methods for measurement of the modulation transfer function (MTF) for time-delay-and-integrate (TDI) charge coupled device (CCD) image sensors
Front-side illuminated CMOS spectral pixel response and modulation transfer function characterization: impact of pixel layout details and pixel depletion volume
Measuring a laser focal spot on a large intensity range: effect of optical component laser damages on the focal spot