20 August 2009 Failure analysis methods applied to PV module reliability
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In the testing of photovoltaic materials and modules, failure analysis provides insights into the specific mechanism of performance breakdown and offers opportunities to improve performance by materials or process modification. We review various analytical methods applied to photovoltaic modules and test structures to better understand the nature of failure, including several methods not previously discussed in failure analysis literature as applied to photovoltaic devices. Included in this discussion will be the use of environmental scanning electron microscopy (ESEM) and x-ray microtomography to investigate the failure mechanism in electrical impulse testing of a candidate PV module.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William J. Gambogi, William J. Gambogi, Elizabeth F. McCord, Elizabeth F. McCord, H. David Rosenfeld, H. David Rosenfeld, Roger H. Senigo, Roger H. Senigo, Scott Peacock, Scott Peacock, Katherine M. Stika, Katherine M. Stika, } "Failure analysis methods applied to PV module reliability", Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120P (20 August 2009); doi: 10.1117/12.826956; https://doi.org/10.1117/12.826956


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