20 August 2009 Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability
Author Affiliations +
Proceedings Volume 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II; 74120R (2009); doi: 10.1117/12.826876
Event: SPIE Solar Energy + Technology, 2009, San Diego, California, United States
Abstract
A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic (PV) systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it can be used to predict current reliability, but it cannot currently be used to accurately predict lifetime. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. Robert Sorensen, Michael A. Quintana, Joseph D. Puskar, Samuel J. Lucero, "Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability", Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120R (20 August 2009); doi: 10.1117/12.826876; https://doi.org/10.1117/12.826876
PROCEEDINGS
11 PAGES


SHARE
KEYWORDS
Resistance

Reliability

Polymers

Metals

Failure analysis

Photovoltaics

Systems modeling

Back to Top