21 August 2009 Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides
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Abstract
We utilize analysis of third harmonic generation under femtosecond pulsed excitation as a reference free measurement method for third order nonlinear susceptibility (χ(3) or "Chi 3") of planar waveguides. We investigate χ(3) dispersion in planar Ta2O5 waveguides at wavelengths either side of the telecoms window, obtaining a nonlinear coefficient of 2 ×10−13 esu, at 1550 nm. Our study indicates that χ(3) increases within the measured wavelength range due to a threephoton resonance of Ta2O5 electrons, revealing the potential of this material system in high speed integrated nonlinear optical switches for the telecommunications spectral window.
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Ruiqi Y. Chen, Martin D. B. Charlton, Pavlos G. Lagoudakis, "Reference free Chi 3 dispersion measurements in planar tantalum pentoxide waveguides", Proc. SPIE 7420, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications III, 74200D (21 August 2009); doi: 10.1117/12.825085; https://doi.org/10.1117/12.825085
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