10 September 2009 Digital multiple wavelength phase shifting algorithm
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Proceedings Volume 7432, Optical Inspection and Metrology for Non-Optics Industries; 74320N (2009); doi: 10.1117/12.823903
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States
Abstract
This paper presents a digital multiple-wavelength phase-shifting technique for three-dimensional shape measurement. The projected phase-shifted fringe images have wavelengths of λκ = W/2κ-1 (k = 1,2,3...). The phase unwrapping is not needed for the longest wavelength because a single fringe covers the whole area. The shorter wavelength phase, φκ(x,y), is unwrapped by referring to the previously unwrapped longer wavelength phase, Φk-1(x,y), pixel by pixel without accessing its neighborhood pixels. Experiments demonstrate that this technique has low noise and less sensitivity to motion. It can be used to measure arbitrary step height and multiple objects simultaneously.
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Song Zhang, "Digital multiple wavelength phase shifting algorithm", Proc. SPIE 7432, Optical Inspection and Metrology for Non-Optics Industries, 74320N (10 September 2009); doi: 10.1117/12.823903; https://doi.org/10.1117/12.823903
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KEYWORDS
Phase shifts

3D metrology

Algorithm development

Projection systems

Cameras

Phase shift keying

Photography

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