21 August 2009 From design to assembly: getting the most from your optical software
Author Affiliations +
Sequential and non-sequential optical codes can be used for much more than the initial design and analysis of idealized optical and illumination systems. The design process usually assumes ideal components, ignoring realistic properties such as surface and volume scatter, Fresnel reflections, and polarization aberrations. These codes can also be used to perform tolerance analysis on these designs to help determine manufacturability limits. An important extension in the use of these programs is to create simulations based on the as-built components which include realistic optical surface and scatter scenarios. For example, modeling the measured optical quality of a fabricated primary mirror surface provides the opportunity to modify other optical or mechanical parameters to compensate for any surface errors, which in turn, can relieve critical tolerance limits. Optical analysis codes can also be used to model the performance of an optical system during assembly and testing to isolate defects and perturbations which cause the system performance to be out of specification. Interferometric or polarimetric data measured at several locations across the field of view can be used in the optical program to help identify out of tolerance components. These capabilities are of particular importance in eccentric systems as well as in polarization critical systems, provided the optical code can realistically model data in this form.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mary G. Turner, Mary G. Turner, Jon A. Herlocker, Jon A. Herlocker, } "From design to assembly: getting the most from your optical software", Proc. SPIE 7433, Optical System Alignment, Tolerancing, and Verification III, 74330N (21 August 2009); doi: 10.1117/12.829202; https://doi.org/10.1117/12.829202


WFIRST coronagraph optical modeling
Proceedings of SPIE (September 01 2017)
Feature-based ATR performance method for FLIR
Proceedings of SPIE (September 02 2004)
Return of feature-based cost modeling
Proceedings of SPIE (October 09 1998)
Ray tracing from finite element results
Proceedings of SPIE (September 16 1993)

Back to Top