31 August 2009 Off-plane grating spectrometer for the International X-ray Observatory
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Proceedings Volume 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV; 74370H (2009); doi: 10.1117/12.827980
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States
Abstract
A dispersive spectrometer onboard the International X-ray Observatory (IXO) provides a method for high throughput and high spectral resolution at X-ray energies below 1 keV. An off-plane reflection grating array maximizes these capabilities. We present here a mature mechanical design that places the grating array on the spacecraft avionics bus 13.5 m away from the focal plane. In addition, we present the technology development plan for advancing the Technology Readiness Level to 6 for the Off-Plane X-ray Grating Spectrometer.
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Randall L. McEntaffer, Neil J. Murray, Andrew Holland, Charles Lillie, Suzanne Casement, Dean Dailey, Tim Johnson, Webster C. Cash, Phillip H. Oakley, Ted Schultz, David N. Burrows, "Off-plane grating spectrometer for the International X-ray Observatory", Proc. SPIE 7437, Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV, 74370H (31 August 2009); doi: 10.1117/12.827980; http://dx.doi.org/10.1117/12.827980
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KEYWORDS
Charge-coupled devices

X-rays

Telescopes

Space telescopes

Spectroscopy

Spectral resolution

CCD cameras

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