Paper
8 September 2009 New microfocus source for x-ray diffractometry in the home-lab
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Abstract
The increasing importance of X-ray diffractometry with one- and two-dimensional detectors for materials research has lead to a rising demand for highly intense X-ray sources enabling the analysis of very small and weakly scattering samples in the home-lab within a reasonable time frame. As a result, various microfocusing sealed tube X-ray sources with focal spot sizes below 50μm are now available. Potential applications of the low-maintenance, high-brilliance microfocus source IμS, which are equipped with different two-dimensional beam shaping multilayer optics, will be shown. With the instrumentation that is now available, more and more crucial measurements like gracing incidence small angle X-ray scattering or stress and pole figure measurements can be carried out in the lab, and even in-situ during dynamic processes. Some ideas on new instrumental set-ups for customized X-ray analytics will also be shown.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bernd Hasse, Jörg Wiesmann, and Carsten Michaelsen "New microfocus source for x-ray diffractometry in the home-lab", Proc. SPIE 7448, Advances in X-Ray/EUV Optics and Components IV, 74480Q (8 September 2009); https://doi.org/10.1117/12.824855
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KEYWORDS
X-rays

Sensors

X-ray sources

Silver

Molybdenum

X-ray diffraction

Scattering

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