8 September 2009 Evaluation of data storage layer thickness best fitted for digital data read-out procedure from hard x-ray optical memory
Author Affiliations +
Abstract
Paper is devoted to further evolution of the concept of ultra-high density hard x-ray storage media - a radically new x-ray- based optical data storage nanotechnology with terabit-scale digital data density per square centimeter of each storage layer of the memory disk. Forthcoming hard x-ray optical data read-out devices will use an ultra-high density information carrier named x-ray optical memory (X-ROM), which consists of crystalline wafer with the generated sub-surface amorphous nanometer-size reflecting speckles of x-ray high-reflectivity material. X-ROM is designed for long-term archiving of the large volumes of information and digital data handling via read-out systems operating on x-ray wavelength optics. Digital data read-out procedure from X-ROM is performed via grazing-angle incident x-ray micro beam. X-ray-based optical data storage system detects data by measuring changes in x-ray micro beam intensity reflected from the various surface points of data storage media. Grazing-angle incident x-ray configuration allows the handling of data from very large surface area of X-ROM disk and, consequently, the data read-out speed is much faster than in optical data read-out systems. Aim of paper is detailed evaluation of storage data-layer's effective thickness best fitted for a digital data read-out procedure. Penetration depths of non-homogeneous x-ray wave fields inside crystalline substrate and amorphous speckles of X-ROM are investigated theoretically in case of grazing-angle incidence x-ray backscattering diffraction (GIXB) applied in specular beam suppression mode. It is possible to reduce the effective thickness of data storage layer to a value of less than a single-bit linear size i.e. to reduce effective thickness up to 10 nm, according to performed evaluations.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hakob P. Bezirganyan, Hakob P. Bezirganyan, Siranush E. Bezirganyan, Siranush E. Bezirganyan, Petros H. Bezirganyan, Petros H. Bezirganyan, Hayk H. Bezirganyan, Hayk H. Bezirganyan, } "Evaluation of data storage layer thickness best fitted for digital data read-out procedure from hard x-ray optical memory", Proc. SPIE 7448, Advances in X-Ray/EUV Optics and Components IV, 74480T (8 September 2009); doi: 10.1117/12.826034; https://doi.org/10.1117/12.826034
PROCEEDINGS
10 PAGES


SHARE
Back to Top