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The synchrotron radiation (SR) X-ray absorption fine-structure spectroscopy (XAFS) technology has been employed to
obtained Zn K-edge absorption spectra for Cd11-xZnxTe alloy with x = 0.03, 0.10, 0.20, 0.30, 0.40, 0.50 and 1.00. Their
Fourier transform spectra were analyzed, which have shown a bimodal distribution of bond lengths, suggesting distortion
of the Te sub-lattice, so that the linear interpolation is true only in an approximate sense. Synthetic CdZnTe crystals can
be used for the room temperature-based detection of gamma radiation. The radiation detection properties of CZT crystals
vary widely. A common defect found in most high-quality CZT crystals is Te secondary phases, often located along
grain boundaries. The secondary phases can be both large inclusions (>50 μm) and smaller precipitates (<50 μm). The
Te secondary phases distributed throughout the crystal can cause changes to the detector leakage current, resulting in
decreased radiation spectrometer performance. This set of Cd1-xZnxTe crystals were also measured by Raman scattering
at room temperature. The two observed peaks at about 125 and 145 cm-1 which can be assigned to Te A1 and E phonon
mode, respectively. The induced damage on the crystal surfaces by Raman laser has been discussed. It is suggested that
in the case of highly Zn doping CdZnTe crystals, the ZnTe bond were broken by laser exposing and then free Te atoms
are migrating to these heated areas which cause Te precipitate. Further, the results of the soft X-ray measurements have
been also presented and this part of the experimental data needs to do more penetrating analysis in the future.
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