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21 September 2009 A quantum-limited CMOS-sensor-based high-speed imaging system for time-resolved x-ray scattering
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Abstract
The field of ultrafast x-ray science is flourishing, driven by emerging synchrotron sources (e.g., time-slice storage rings, energy recovery linacs, free electron lasers) capable of fine time resolution. New hybrid x-ray detectors are under development in order to exploit these new capabilities. This paper describes the development of a 2160 x 2560 CMOS image sensor (CIS) system with a 6.5 µm pitch optimized for time-resolved x-ray scattering studies. The system is single photon quantum limited from 8 keV to 20 keV. It has a wide dynamic range and can operate at 100 Hz full-frame and at higher frequencies using a region-of-interest (ROI) readout. Fundamental metrics of linearity, dynamic range, spatial resolution, conversion gain, sensitivity and Detective Quantum Efficiency are estimated. Experimental time-resolved data are also presented.
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Brian Rodricks, Boyd Fowler, Chiao Liu, John Lowes, Lucas J. Koerner, Mark W. Tate, and Sol M. Gruner "A quantum-limited CMOS-sensor-based high-speed imaging system for time-resolved x-ray scattering", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74490Y (21 September 2009); https://doi.org/10.1117/12.828329
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