Paper
10 September 1987 On-Line Particle And Flow Holography
J. D. Trolinger, J. E. Craig, C. F. Hess, H. Tan
Author Affiliations +
Proceedings Volume 0746, Industrial Laser Interferometry; (1987) https://doi.org/10.1117/12.939778
Event: OE LASE'87 and EO Imaging Symposium, 1987, Los Angeles, CA, United States
Abstract
Holographic interferometry has received many plaudits as an extremely powerful flow diagnostic method while users have languished at the cumbersome methods available and long time required to extract even the elementary data from the hologram. Recent years have seen breakthroughs that, when combined, will address the problems of producing the usable raw data quickly (the processed hologram) and transferring it into a computer in a tractable form. Keys to the former are either thermoplastic devices or on-line film processors. Keys to the latter are electronic imaging and analyzing systems that can digitize data reconstructed from holograms and then perform complex operations on the digitized data. The authors have tested, individually, all of the components required for producing fully refined, on-line density data in wind tunnels employing holographic interferometry systems, and are currently developing the fully integrated system. This paper describes the state-of-the-art system concept, components, options, and potential capabilities for realizable systems.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. D. Trolinger, J. E. Craig, C. F. Hess, and H. Tan "On-Line Particle And Flow Holography", Proc. SPIE 0746, Industrial Laser Interferometry, (10 September 1987); https://doi.org/10.1117/12.939778
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Holograms

Holography

Particles

Image analysis

Photography

3D image reconstruction

Holographic interferometry

Back to Top