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17 May 2010 Novel optoelectronic system for fast acquisition of reflection spectra
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Abstract
We present novel optical system capable for fast acquisition of two-dimensional distribution of reflection spectra with high spatial resolution. It is based on a subspace vector model of surface reflections. The system consists of a computer controlled set of light-emitting diodes (LED) and a monochrome CCD camera. Spatial distribution of reflection spectra is acquired in the compressed form. These compressed data can be directly used for accurate classification or recognition of different parts of the surface under study. We demonstrated experimentally that 2D distribution of spectral reflectance from the object surface can be captured within 140ms. Such a fast instrument of multispectral imaging could be extremely useful particularly for researchers who study living biological objects.
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V. Teplov, L. Fauch, R. Saarenheimo, E. Nippolainen, and A. A. Kamshilin "Novel optoelectronic system for fast acquisition of reflection spectra", Proc. SPIE 7469, ROMOPTO 2009: Ninth Conference on Optics: Micro- to Nanophotonics II, 74690S (17 May 2010); https://doi.org/10.1117/12.866772
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