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20 October 2009 Design of lath-shaped tool in defective nanostructure removal from digital touch-panel surfaces
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Proceedings Volume 7493, Second International Conference on Smart Materials and Nanotechnology in Engineering; 74934K (2009) https://doi.org/10.1117/12.840503
Event: Second International Conference on Smart Materials and Nanotechnology in Engineering, 2009, Weihai, China
Abstract
An effective economic viability that uses micro electroremoval as a reclaim system was developed to remove the defective ITO nanostructure coatings from the optical PET surfaces of digital paper. The low yield of ITO thin film deposition is an important factor in semiconductor production. By establishing the reclaim process using the ultra-precise removal of the nanostructure coatings, the optoelectronic semiconductor industry can effectively reclaim defective products, minimizing both production costs and pollution. In the current experiment, a large lath-shaped cathode with a small gap-width between the cathode and the workpiece takes less time for the same amount of ITO removal. A small end radius of the cathode combines with enough electric power to drive fast machining. Pulsed direct current can improve the effect of dreg discharge, and it is advantageous to associate the workpiece with the fast feed rate. However, this improvement can increase the current rating. A high rotational speed of the electrodes, a higher temperature, or a large flow rate of the electrolyte corresponds to a higher removal rate for the ITO nanostructure. The micro electroremoval requires only a short period of time to remove the ITO thin film coatings easily and cleanly.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. S. Pa "Design of lath-shaped tool in defective nanostructure removal from digital touch-panel surfaces", Proc. SPIE 7493, Second International Conference on Smart Materials and Nanotechnology in Engineering, 74934K (20 October 2009); https://doi.org/10.1117/12.840503
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