30 October 2009 Simulation of vignetting effect in thermal imaging system
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Proceedings Volume 7494, MIPPR 2009: Multispectral Image Acquisition and Processing; 749427 (2009) https://doi.org/10.1117/12.831306
Event: Sixth International Symposium on Multispectral Image Processing and Pattern Recognition, 2009, Yichang, China
Vignetting effect is a kind of typical nonlinear effect in the thermal imaging system and it will induce the central region of the infrared image is bright, while the edge region is dark. This geometric phenomenon generates because the radiation illumination which reaches the detector's surface decreases gradually with the increase of off-axis distance. Vignetting makes infrared imaging system receive uneven effective energy of incident light-ray from different angle, and the output signal is uneven sequentially. At last the final infrared image brings undue light or dark distortion and the generated infrared image is inconsistent with the real scene. Infrared imaging system works under low contrast between 1 percent and 2 percent. Therefore, the vignetting effect of thermal imaging system influences the quality of infrared imaging seriously. So the exact modeling of vignetting effect is vital for generating an infrared simulation image through optical system. This paper builds a realistic model for the vignetting effect resulted from infrared optical system and analyses the cause of the vignetting effect theoretically. Then simulation is carried out and the simulated results show that the simulation method of vignetting effect can provide the more precise and real infrared image signal to evaluate the capability of infrared imaging system and advance the whole performance.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiyan Li, Min Zhu, "Simulation of vignetting effect in thermal imaging system", Proc. SPIE 7494, MIPPR 2009: Multispectral Image Acquisition and Processing, 749427 (30 October 2009); doi: 10.1117/12.831306; https://doi.org/10.1117/12.831306

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