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5 August 2009 Radiation results of the SEE test of Xilinx XC3S400 FPGA instances
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Proceedings Volume 7502, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2009; 75020P (2009) https://doi.org/10.1117/12.838253
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2009, 2009, Wilga, Poland
Abstract
In modern High Energy Physics Experiments the electronics modules for controlling and/or data acquisition are very often exposed to high neutron radiation. It's well known that it can cause many failures during work of such systems, even total break downs. In such case, the studies of radiation sensitivity of electronic devices should take place to avoid problems during the lifetime of the experiments. This article describes the Single Event Effects (SEE) tests of Xilinx Spartan3 XC3S400 FPGA populated on Altium Live Design Evaluation Board. The results of the tests are presented and discussed. Additionaly gamma-ray spectrometry analysis of the board has been performed.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stefan Korolczuk, Dominik Rybka, Tomasz Szczesniak, Radoslaw Marcinkowski, and Łukasz Świderski "Radiation results of the SEE test of Xilinx XC3S400 FPGA instances", Proc. SPIE 7502, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2009, 75020P (5 August 2009); https://doi.org/10.1117/12.838253
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