31 December 2009 Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films
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Abstract
In this contribution we will summarize the fundamental mechanisms that lead to subpicosecond laser damage in dielectric films, discuss the resulting scaling laws of single pulse (1-on-1) damage with respect to pulse duration and bandgap, of the multiple pulse (S-on-1) damage threshold as a function of pulse number, and compare these findings to recent experimental results.
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L. A. Emmert, L. A. Emmert, D. N. Nguyen, D. N. Nguyen, M. Mero, M. Mero, W. Rudolph, W. Rudolph, D. Ristau, D. Ristau, K. Starke, K. Starke, M. Jupé, M. Jupé, C. S. Menoni, C. S. Menoni, D. Patel, D. Patel, E. Krous, E. Krous, } "Fundamental processes controlling the single and multiple femtosecond pulse damage behavior of dielectric oxide films", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75040P (31 December 2009); doi: 10.1117/12.836508; https://doi.org/10.1117/12.836508
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