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31 December 2009 Process for rapid detection of fratricidal defects on optics using linescan phase-differential imaging
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Abstract
Phase-defects on optics used in high-power lasers can cause light intensification leading to laser-induced damage of downstream optics. We introduce Linescan Phase Differential Imaging (LPDI), a large-area dark-field imaging technique able to identify phase-defects in the bulk or surface of large-aperture optics with a 67 second scan-time. Potential phase-defects in the LPDI images are indentified by an image analysis code and measured with a Phase Shifting Diffraction Interferometer (PSDI). The PSDI data is used to calculate the defects potential for downstream damage using an empirical laser-damage model that incorporates a laser propagation code. A ray tracing model of LPDI was developed to enhance our understanding of its phase-defect detection mechanism and reveal limitations.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Frank L. Ravizza, Michael C. Nostrand, Laura M. Kegelmeyer, Ruth A. Hawley, and Michael A. Johnson "Process for rapid detection of fratricidal defects on optics using linescan phase-differential imaging", Proc. SPIE 7504, Laser-Induced Damage in Optical Materials: 2009, 75041B (31 December 2009); https://doi.org/10.1117/12.836990
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