Translator Disclaimer
Paper
25 November 2009 Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)
Author Affiliations +
Abstract
We present a new high-speed lifetime measurement scheme of analog mean-delay (AMD) method which is suitable for studying dynamical time-resolved spectroscopy and high-speed fluorescence lifetime imaging microscopy (FLIM). In our lifetime measurement method, the time-domain intensity of a decaying fluorescence light source is acquired as an analog waveform, and the lifetime information of the source is extracted from the calculated mean temporal delay of the waveform.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sucbei Moon, Youngjae Won, and Dug Young Kim "Analog mean delay method (AMD) for real-time fluorescence lifetime microscopy (FLIM)", Proc. SPIE 7506, 2009 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 750605 (25 November 2009); https://doi.org/10.1117/12.848242
PROCEEDINGS
8 PAGES


SHARE
Advertisement
Advertisement
Back to Top