Paper
23 November 2009 Anti aliasing technique in small object surface measurement
Sheng Wei, Nansheng Liu, Xiaorui Liu, Yiqing Wei, Xiaopu Ai, Xian Hu
Author Affiliations +
Abstract
The π phase-shifting technique have used early to remedy frequency aliasing in Fourier transform profilometry , two deforming stripe of phase difference π is photographed and then subtracted to remove the influence of zero frequency and high frequency. Due to background of measured object represent zero frequency of deforming stripe in frequency-domain, image processing based wavelet transform is described to separate background image through image wavelet decomposition, then original image and background image is subtracted to remove the influence of zero frequency, and so fundamental frequency extracted easily. The proposed method reserve merit of frequency domain phase demodulation with low equipment cost and fast convenience. The proposed method is tested through three-dimensional surface sensing experiment of arc welding pool.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sheng Wei, Nansheng Liu, Xiaorui Liu, Yiqing Wei, Xiaopu Ai, and Xian Hu "Anti aliasing technique in small object surface measurement", Proc. SPIE 7508, 2009 International Conference on Optical Instruments and Technology: Advanced Sensor Technologies and Applications, 75081K (23 November 2009); https://doi.org/10.1117/12.838349
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Fringe analysis

Wavelets

Wavelet transforms

Optical filters

Fourier transforms

3D image processing

Phase shifts

RELATED CONTENT

Single image method to depict 3D profiles
Proceedings of SPIE (March 08 2013)
Frequency domain methods in digital photoelasticity
Proceedings of SPIE (June 13 2001)
Improvements of embedded zerotree wavelet (EZW) coding
Proceedings of SPIE (April 21 1995)
Optical Harr wavelet transform for image feature extraction
Proceedings of SPIE (November 01 1993)

Back to Top