24 November 2009 Development and application of wedge-shaped probes in an ultrafast measurement system
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Proceedings Volume 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration; 75090J (2009) https://doi.org/10.1117/12.840144
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China
Abstract
A wedge-shaped probe is developed and applied for the detection of transient electrical signals in an ultrafast scanning tunneling microscope measurement system. The probe is composed of a low- temperature grown GaAs photoconductive switch and a metal tip with a diameter of 5 micrometers. The designed probe functions as a sampler of transient signals generated by a sample of coplanar strip photoconductive switch with ultrafast optical pulses of 100 fs in the ultrafast measurement system. The shape of the probe makes the approach of the probe to the sample in a way that is much easier than the traditional rectangular one. The metal tip is attached to the coplanar strip transmission line integrated in the photoconductive switch. The design of the probe is presented and its performances have been reported in this paper. Photo of the wedge-shaped probe is given and transient signals in picoseconds were observed in contact mode with the developed wedge-shaped probe.
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Tian Lan, Tian Lan, Siying Chen, Siying Chen, Cuiling Li, Cuiling Li, Guoqiang Ni, Guoqiang Ni, "Development and application of wedge-shaped probes in an ultrafast measurement system", Proc. SPIE 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 75090J (24 November 2009); doi: 10.1117/12.840144; https://doi.org/10.1117/12.840144
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