24 November 2009 Study on infrared optical switching of vanadium dioxide thin film
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Proceedings Volume 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration; 75090P (2009) https://doi.org/10.1117/12.837452
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China
Abstract
Dispersion theory for refractive index and extinction coefficient of vanadium dioxide thin film is studied, and its temperature-dependence dispersion formula of optical constants is presented by numerical fitting with Sellmeier dispersion model. The optical transmittance and reflectance at different temperature and wavelength is calculated using film matrix theory. Vanadium dioxide thin films with different thickness are deposited by magnetron sputtering on glass, sapphire and silicon dioxide substrates, and the optical transmittance and reflectivity of the films are measured, and the experiment curve agrees well with that of simulation.
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Haifang Wang, Haifang Wang, Yi Li, Yi Li, Xiaojing Yu, Xiaojing Yu, Huiqun Zhu, Huiqun Zhu, Yize Huang, Yize Huang, Hu Zhang, Hu Zhang, Wei Zhang, Wei Zhang, } "Study on infrared optical switching of vanadium dioxide thin film", Proc. SPIE 7509, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 75090P (24 November 2009); doi: 10.1117/12.837452; https://doi.org/10.1117/12.837452
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