20 November 2009 Used digital speckle correlation method to measure vibration
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Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 75110V (2009); doi: 10.1117/12.835998
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China
Abstract
Used digital speckle correlation method (DSCM) to measure is researched. The experiment is designed and the laser irradiates a PZT which is driven by some signal to obtain the dynamic speckle patterns. The dynamic speckle patterns are shot by CCD, then the DSCM is used to process the sequential images and also the experiment is simulated. The movement of reflection target is controlled by PZT which is driven by the different model signal. When the reflection target is moving, the dynamic speckle patterns are shot by CCD, the sequential images are stored in computer through an image board. Then the digital speckle correlation method is used to process the sequential images. There are three output parameters after the images correlation calculation: (xi ,yi) and α that represent for position and moving direction of the object, Initial (xi ,yi) is (0,0). (▵xi , ▵yi) represents pixel difference in coordinates of two adjacent images. α is the angle specifying the direction of the object's motion relative to the x-axis: αε[00,900]. Varying the speed of the aluminum plate, variant values of (▵xi ,▵i) are obtained and varying the direction of numeric control caterpillar track, variant values of α were obtained. From the obtained displacement and the collected frequency, the vibration frequency was obtained. The experimental results show the DSCM can confirm the frequency and displacement of vibration, and have a good agreement with the simulation results, and the results show the digital speckle correlation method can be used to measure vibation.
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Haitao Yan, Zhiqiang Zhen, Zhengxin Tang, "Used digital speckle correlation method to measure vibration", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 75110V (20 November 2009); doi: 10.1117/12.835998; http://dx.doi.org/10.1117/12.835998
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KEYWORDS
Speckle

Speckle pattern

Charge-coupled devices

Diffusers

Aluminum

Ferroelectric materials

Image processing

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