Terahertz emission of photoconductive antenna under different biased electrical fields

Lizhong Wu; Guozhong Zhao; Cunlin Zhang

doi:10.1117/12.837503

18 November 2009 Terahertz emission of photoconductive antenna under different biased electrical fields

Lizhong Wu, Guozhong Zhao, Cunlin Zhang

Proceedings Volume 7512, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Information Security; 75120F (2009) https://doi.org/10.1117/12.837503
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

THz emission characteristics of the low-temperature grown GaAs photoconductive antenna under the various types of biased electrical fields are investigated. The biased electric fields including DC (direct current) and AC (sine wave and square wave) are applied on the antenna to reveal the evolution of THz wave. At the condition of effective voltage kept as same and the various frequencies lied between 1 kHz and 9 kHz, we confirmed that the optimized frequency of the biased electrical field is 6 kHz for the sine wave and square wave, respectively. For the case of same effective voltage or biased electric field, the experimental results show that THz signal generated by the sine wave is more efficient than the DC and square wave; this is attributed to the sine wave with higher amplitude of biased electric field. Whereas the experimental results show that the intensity and the signal-to-noise ratio of the THz radiations generated by the square wave are stronger than that of sine wave under the same amplitude of biased electric field, this is caused by the higher effective voltage for the square wave. Therefore, our results indicate that the frequency and type of biased electric fields take an important effect on the intensity and signal-to-noise ratio of the generated THz radiations.

Citation Download Citation

Lizhong Wu, Guozhong Zhao, and Cunlin Zhang "Terahertz emission of photoconductive antenna under different biased electrical fields", Proc. SPIE 7512, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Information Security, 75120F (18 November 2009); https://doi.org/10.1117/12.837503

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