PROCEEDINGS VOLUME 7513
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY | 19-22 OCTOBER 2009
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTATION AND TECHNOLOGY
19-22 October 2009
Shanghai, China
Front Matter: Volume 7513
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751301 (4 December 2009); doi: 10.1117/12.853043
3D Shape Measurement and Profilometry
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751302 (4 November 2009); doi: 10.1117/12.837891
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751303 (24 November 2009); doi: 10.1117/12.838075
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751304 (24 November 2009); doi: 10.1117/12.838298
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751305 (24 November 2009); doi: 10.1117/12.837902
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751306 (24 November 2009); doi: 10.1117/12.838194
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751307 (24 November 2009); doi: 10.1117/12.839701
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751308 (24 November 2009); doi: 10.1117/12.838348
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751309 (24 November 2009); doi: 10.1117/12.838207
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130A (24 November 2009); doi: 10.1117/12.838070
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130B (24 November 2009); doi: 10.1117/12.840034
Optical Methods for Industrial Applications
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130C (24 November 2009); doi: 10.1117/12.838152
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130D (24 November 2009); doi: 10.1117/12.838359
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130E (24 November 2009); doi: 10.1117/12.837984
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130F (24 November 2009); doi: 10.1117/12.839698
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130G (24 November 2009); doi: 10.1117/12.838064
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130H (24 November 2009); doi: 10.1117/12.837151
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130I (24 November 2009); doi: 10.1117/12.838067
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130J (24 November 2009); doi: 10.1117/12.835999
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130K (24 November 2009); doi: 10.1117/12.837468
Remote Sensing, Lidar, and Environmental Applications
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130L (24 November 2009); doi: 10.1117/12.837665
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130M (24 November 2009); doi: 10.1117/12.837954
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130N (24 November 2009); doi: 10.1117/12.837809
Imaging, Processing Algorithm, and Analysis
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130O (24 November 2009); doi: 10.1117/12.837847
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130P (24 November 2009); doi: 10.1117/12.837796
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130Q (24 November 2009); doi: 10.1117/12.837003
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130R (24 November 2009); doi: 10.1117/12.837595
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130S (24 November 2009); doi: 10.1117/12.837869
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130T (24 November 2009); doi: 10.1117/12.840090
Poster Session
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130U (24 November 2009); doi: 10.1117/12.834931
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130V (24 November 2009); doi: 10.1117/12.835966
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130W (24 November 2009); doi: 10.1117/12.836550
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130X (24 November 2009); doi: 10.1117/12.836641
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130Y (24 November 2009); doi: 10.1117/12.837019
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130Z (25 November 2009); doi: 10.1117/12.837106
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751310 (25 November 2009); doi: 10.1117/12.837124
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751311 (25 November 2009); doi: 10.1117/12.837288
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751312 (25 November 2009); doi: 10.1117/12.837397
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751313 (25 November 2009); doi: 10.1117/12.837439
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751314 (25 November 2009); doi: 10.1117/12.837588
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751315 (25 November 2009); doi: 10.1117/12.837590
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751316 (26 November 2009); doi: 10.1117/12.837603
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751317 (25 November 2009); doi: 10.1117/12.837656
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751318 (25 November 2009); doi: 10.1117/12.837672
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751319 (25 November 2009); doi: 10.1117/12.837675
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131A (25 November 2009); doi: 10.1117/12.837678
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131B (25 November 2009); doi: 10.1117/12.837680
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131C (25 November 2009); doi: 10.1117/12.837724
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131D (25 November 2009); doi: 10.1117/12.837732
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131E (25 November 2009); doi: 10.1117/12.837735
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131F (25 November 2009); doi: 10.1117/12.837748
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131G (25 November 2009); doi: 10.1117/12.837751
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131H (25 November 2009); doi: 10.1117/12.837762
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131I (25 November 2009); doi: 10.1117/12.837767
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131J (25 November 2009); doi: 10.1117/12.837768
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131K (24 November 2009); doi: 10.1117/12.837789
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131L (25 November 2009); doi: 10.1117/12.837810
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131M (25 November 2009); doi: 10.1117/12.837811
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131N (25 November 2009); doi: 10.1117/12.837818
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131O (25 November 2009); doi: 10.1117/12.837819
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131P (25 November 2009); doi: 10.1117/12.837844
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131Q (25 November 2009); doi: 10.1117/12.837859
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131R (25 November 2009); doi: 10.1117/12.837886
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131S (25 November 2009); doi: 10.1117/12.837890
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131T (25 November 2009); doi: 10.1117/12.837893
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131U (25 November 2009); doi: 10.1117/12.837917
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131V (25 November 2009); doi: 10.1117/12.837947
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131W (25 November 2009); doi: 10.1117/12.837958
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131X (25 November 2009); doi: 10.1117/12.837962
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131Y (25 November 2009); doi: 10.1117/12.838004
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131Z (25 November 2009); doi: 10.1117/12.838006
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751320 (25 November 2009); doi: 10.1117/12.838007
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751321 (25 November 2009); doi: 10.1117/12.838008
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751322 (25 November 2009); doi: 10.1117/12.838009
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751323 (25 November 2009); doi: 10.1117/12.838013
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751324 (25 November 2009); doi: 10.1117/12.838016
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751325 (25 November 2009); doi: 10.1117/12.838024
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751326 (25 November 2009); doi: 10.1117/12.838027
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751327 (25 November 2009); doi: 10.1117/12.838031
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751328 (25 November 2009); doi: 10.1117/12.838062
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751329 (25 November 2009); doi: 10.1117/12.838069
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132A (25 November 2009); doi: 10.1117/12.838096
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132B (25 November 2009); doi: 10.1117/12.838106
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132C (25 November 2009); doi: 10.1117/12.838118
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132D (25 November 2009); doi: 10.1117/12.838143
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132E (25 November 2009); doi: 10.1117/12.838145
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132F (25 November 2009); doi: 10.1117/12.838180
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132G (25 November 2009); doi: 10.1117/12.838192
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132H (25 November 2009); doi: 10.1117/12.838196
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132I (25 November 2009); doi: 10.1117/12.838199
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132J (25 November 2009); doi: 10.1117/12.838215
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132K (25 November 2009); doi: 10.1117/12.838217
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132L (25 November 2009); doi: 10.1117/12.838222
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132M (25 November 2009); doi: 10.1117/12.838264
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132N (25 November 2009); doi: 10.1117/12.838266
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132O (24 November 2009); doi: 10.1117/12.838332
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132P (25 November 2009); doi: 10.1117/12.838421
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132Q (24 November 2009); doi: 10.1117/12.839496
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132R (24 November 2009); doi: 10.1117/12.839553
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132S (24 November 2009); doi: 10.1117/12.839637
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132T (24 November 2009); doi: 10.1117/12.839658
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132U (24 November 2009); doi: 10.1117/12.839661
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132V (24 November 2009); doi: 10.1117/12.839662
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132W (24 November 2009); doi: 10.1117/12.839693
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132X (25 November 2009); doi: 10.1117/12.839937
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132Y (25 November 2009); doi: 10.1117/12.839974
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75132Z (24 November 2009); doi: 10.1117/12.840012
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751330 (24 November 2009); doi: 10.1117/12.840021
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751331 (24 November 2009); doi: 10.1117/12.840022
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751332 (24 November 2009); doi: 10.1117/12.840085
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751333 (24 November 2009); doi: 10.1117/12.840102
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751334 (24 November 2009); doi: 10.1117/12.840218
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