Stripes extraction technique of projection pattern in frequency domain for 3D shape measurement based pattern projection technique

Ke Sun; Cunwei Lu

doi:10.1117/12.838075

24 November 2009 Stripes extraction technique of projection pattern in frequency domain for 3D shape measurement based pattern projection technique

Ke Sun, Cunwei Lu

Author Affiliations +

Proceedings Volume 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology; 751303 (2009) https://doi.org/10.1117/12.838075
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

Because the 3-D shape measurement technique using optimal intensity-modulation pattern projection (OIMP) method can detect a lot of stripes numbers by one projection, the application is expected by the spread of the digital camera and the pattern projector. However, there is a problem that the accuracy of stripes recognition decreases in the case of the intensity range of the observation image of the measurement object is insufficient. Or since two images are needed to convert the observation image by the image correction method, saying, OIMP method, the measurement time is long. In order to solve above problem, we propose an image analysis method based on Fourier transform technique to correct the intensity of the observation image. By this method, the stripes can be extracted only using a single observation image, and then, a fast 3-D shape measurement is realizable.

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Ke Sun and Cunwei Lu "Stripes extraction technique of projection pattern in frequency domain for 3D shape measurement based pattern projection technique", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 751303 (24 November 2009); https://doi.org/10.1117/12.838075

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