Color sorting algorithm based on K-means clustering algorithm

BaoFeng Zhang; Qian Huang

doi:10.1117/12.837748

24 November 2009 Color sorting algorithm based on K-means clustering algorithm

BaoFeng Zhang, Qian Huang

Proceedings Volume 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology; 75131F (2009) https://doi.org/10.1117/12.837748
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

In the process of raisin production, there were a variety of color impurities, which needs be removed effectively. A new kind of efficient raisin color-sorting algorithm was presented here. First, the technology of image processing basing on the threshold was applied for the image pre-processing, and then the gray-scale distribution characteristic of the raisin image was found. In order to get the chromatic aberration image and reduce some disturbance, we made the flame image subtraction that the target image data minus the background image data. Second, Haar wavelet filter was used to get the smooth image of raisins. According to the different colors and mildew, spots and other external features, the calculation was made to identify the characteristics of their images, to enable them to fully reflect the quality differences between the raisins of different types. After the processing above, the image were analyzed by K-means clustering analysis method, which can achieve the adaptive extraction of the statistic features, in accordance with which, the image data were divided into different categories, thereby the categories of abnormal colors were distinct. By the use of this algorithm, the raisins of abnormal colors and ones with mottles were eliminated. The sorting rate was up to 98.6%, and the ratio of normal raisins to sorted grains was less than one eighth.

Citation Download Citation

BaoFeng Zhang and Qian Huang "Color sorting algorithm based on K-means clustering algorithm", Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75131F (24 November 2009); https://doi.org/10.1117/12.837748

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KEYWORDS

Image processing

Statistical analysis

Image filtering

Charge-coupled devices

Data centers

Wavelets

Image analysis

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