26 October 2009 Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device
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Abstract
Spectrum analysis technique is introduced to measure the time delay of the silicon-on-insulator (SOI) micro-ring slow light device. The interference spectra of the TE and the TM polarization are obtained based on dual-quadrature spectral interferometry technique. By analyzing the observed spectral interference, the phase and time delay of the output optical pulse of SOI micro-ring is estimated. This method has a very high accuracy of time measurement because it avoids the impact of response speed of optoelectronic device, and moreover, it provides a complete measurement of the complex electric field as a continuous function of frequency.
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Di Yang, Di Yang, Yuntao Li, Yuntao Li, Zhongchao Fan, Zhongchao Fan, Xiao Chen, Xiao Chen, Shai Feng, Shai Feng, Min Lv, Min Lv, Yuping Yang, Yuping Yang, } "Spectrum analysis technique for measuring time delay of light in SOI micro-ring slow light device", Proc. SPIE 7516, Photonics and Optoelectronics Meetings (POEM) 2009: Optoelectronic Devices and Integration, 75160S (26 October 2009); doi: 10.1117/12.844918; https://doi.org/10.1117/12.844918
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