Paper
14 April 2010 Multiscale deformation behavior for multilayered steel by in-situ FE-SEM
Y. Tanaka, S. Kishimoto, F. Yin, M. Kobayashi, T. Tomimatsu, K. Kagawa
Author Affiliations +
Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75220N (2010) https://doi.org/10.1117/12.851570
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore
Abstract
The multi-scale deformation behavior of multi-layered steel during tensile loading was investigated by in-situ FE-SEM observation coupled with multi-scale pattern. The material used was multi-layered steel sheet consisting of martensitic and austenitic stainless steel layers. Prior to in-situ tensile testing, the multi-scale pattern combined with a grid and random dots were fabricated by electron beam lithography on the polished surface in the area of 1 mm2 to facilitate direct observation of multi-scale deformation. Both of the grids with pitches of 10 μm and a random speckle pattern ranging from 200 nm to a few μm sizes were drawn onto the specimen surface at same location. The electron moiré method was applied to measure the strain distribution in the deformed specimens at a millimeter scale and digital images correlation method was applied to measure the in-plane deformation and strain distribution at a micron meter scale acquired before and after at various increments of straining. The results showed that the plastic deformation in the austenitic stainless steel layer was larger than the martensitic steel layer at millimeter scale. However, heterogeneous intrinsic grain-scale plastic deformation was clearly observed and it increased with increasing the plastic deformation.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. Tanaka, S. Kishimoto, F. Yin, M. Kobayashi, T. Tomimatsu, and K. Kagawa "Multiscale deformation behavior for multilayered steel by in-situ FE-SEM", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75220N (14 April 2010); https://doi.org/10.1117/12.851570
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KEYWORDS
Surface finishing

Multilayers

Polishing

Interfaces

Metals

Electron beams

Scanning electron microscopy

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