Crack detection in photovoltaic cells using electronic speckle pattern interferometry

Tzu-Kuei Wen; Ching-Chung Yin

doi:10.1117/12.851695

14 April 2010 Crack detection in photovoltaic cells using electronic speckle pattern interferometry

Tzu-Kuei Wen, Ching-Chung Yin

Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75224Q (2010) https://doi.org/10.1117/12.851695
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore

Abstract

This paper presents a full field nondestructive testing method to inspect the micro-defects embedded in photovoltaic (PV) cells by using electronic speckle pattern interferometry. The edge-clamped solar cells were heated to induce thermal deflection. Interference fringe enhanced by speckle patterns correlated to thermal deformation were determined by subtraction of two pictures recorded at different temperatures and image processing technique based on Fourier optics. The interference fringes produced at the defect free specimen exhibit a number of polygons with regular patterns of bright and dark fringes which are concentric with the center of the specimen. The thermal deformation will be redistributed due to appearance of the defects. The heating-induced interference fringes become quite different from those of the undamaged one. Tangential discontinuities of interference fringes or locally concentric polygon patterns occur in the contiguous area around the micro-defects or damages. The application of large temperature gradient to silicon substrates will induce crack propagation and should be prevented in ESPI inspection.

Citation Download Citation

Tzu-Kuei Wen and Ching-Chung Yin "Crack detection in photovoltaic cells using electronic speckle pattern interferometry", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75224Q (14 April 2010); https://doi.org/10.1117/12.851695

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KEYWORDS

Solar cells

Speckle pattern

Silicon

Speckle

CCD cameras

Inspection

Interferometry

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