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14 April 2010 Influence of OPD in wavelength-shifting interferometry
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Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75225B (2010)
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore
Phase-shifting interferometry is a powerful tool for high accuracy optical measurement. It operates by change the optical path length in the reference arm or test arm. This method practices by move optical device. So it has much problem when the optical device is very large and heavy. For solve this problem, the wavelength-shifting interferometry was put forwarded. In wavelength-shifting interferometry, the phase shifting angle was achieved by change the wavelength of optical source. The phase shifting angle was decided by wavelength and OPD (Optical Path Difference) between test and reference wavefront. So the OPD is an important factor to measure results. But in measurement, because the positional error and profile error of under testing optical element is exist, the phase shifting angle is different in different test point when wavelength scanning, it will introduce phase shifting angle error, so it will introduce optical surface measure error. For analysis influence of OPD on optical surface error, the relation between surface error and OPD was researched. By simulation, the relation between phase shifting error and OPD was established. By analysis, the error compensation method was put forward. After error compensation, the measure results can be improved to great extend.
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Hongjun Wang, Ailing Tian, Bingcai Liu, and Juanjuan Dang "Influence of OPD in wavelength-shifting interferometry", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225B (14 April 2010);

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