14 April 2010 Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects
Author Affiliations +
Proceedings Volume 7522, Fourth International Conference on Experimental Mechanics; 75225G (2010) https://doi.org/10.1117/12.850975
Event: Fourth International Conference on Experimental Mechanics, 2009, Singapore, Singapore
Abstract
Polarization-interferometric nonlinear confocal microscopy is proposed for measuring a nano-sized object (such as nano particle) with lower linear absortion. A three-dimensional distribution of third-order nonlinear dielectric polarization was observed.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chikara Egami, Chikara Egami, Hironori Tanaka, Hironori Tanaka, Haruyuki Murakami, Haruyuki Murakami, Satoshi Ota, Satoshi Ota, } "Polarization-interferometric nonlinear confocal microscopy for measuring nano-sized objects", Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75225G (14 April 2010); doi: 10.1117/12.850975; https://doi.org/10.1117/12.850975
PROCEEDINGS
8 PAGES


SHARE
Back to Top