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18 January 2010 Visual analytics of large multidimensional data using variable binned scatter plots
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Proceedings Volume 7530, Visualization and Data Analysis 2010; 753006 (2010)
Event: IS&T/SPIE Electronic Imaging, 2010, San Jose, California, United States
The scatter plot is a well-known method of visualizing pairs of two-dimensional continuous variables. Multidimensional data can be depicted in a scatter plot matrix. They are intuitive and easy-to-use, but often have a high degree of overlap which may occlude a significant portion of data. In this paper, we propose variable binned scatter plots to allow the visualization of large amounts of data without overlapping. The basic idea is to use a non-uniform (variable) binning of the x and y dimensions and plots all the data points that fall within each bin into corresponding squares. Further, we map a third attribute to color for visualizing clusters. Analysts are able to interact with individual data points for record level information. We have applied these techniques to solve real-world problems on credit card fraud and data center energy consumption to visualize their data distribution and cause-effect among multiple attributes. A comparison of our methods with two recent well-known variants of scatter plots is included.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ming C. Hao, Umeshwar Dayal, Ratnesh K. Sharma, Daniel A. Keim, and Halldór Janetzko "Visual analytics of large multidimensional data using variable binned scatter plots", Proc. SPIE 7530, Visualization and Data Analysis 2010, 753006 (18 January 2010);


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